Invention Grant
- Patent Title: Automated multiple location sampling analysis system
- Patent Title (中): 自动多位置采样分析系统
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Application No.: US13746108Application Date: 2013-01-21
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Publication No.: US09243956B2Publication Date: 2016-01-26
- Inventor: David Day
- Applicant: SCIAPS, INC.
- Applicant Address: US MA Woburn
- Assignee: SciAps, Inc.
- Current Assignee: SciAps, Inc.
- Current Assignee Address: US MA Woburn
- Agency: Iandiorio Teska & Coleman, LLP
- Main IPC: G01J3/00
- IPC: G01J3/00 ; G01J3/443 ; G01J3/06 ; H01L21/66 ; G01J3/02 ; G01J3/44

Abstract:
An analysis system (e.g., LIBS) includes a laser source generating a laser beam, a movable optic configured to move said laser beam to multiple locations on a sample, and a spectrometer responsive to photons emitted by the sample at those locations and having an output. A controller is responsive to a trigger signal and is configured in a moving spot cycle to adjust the moveable optic, activate the laser source sequentially generating photons at multiple locations on the sample, and process the spectrometer output at each location.
Public/Granted literature
- US20140204376A1 Automated Multiple Location Sampling Analysis System Public/Granted day:2014-07-24
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