Invention Grant
- Patent Title: CoMP measurement system and method
- Patent Title (中): CoMP测量系统和方法
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Application No.: US13624759Application Date: 2012-09-21
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Publication No.: US09246558B2Publication Date: 2016-01-26
- Inventor: Boon Loong Ng , Gerardus Johannes Petrus van Lieshout , Young-Han Nam , Himke van der Velde , Jianzhong Zhang , Ying Li , Younsun Kim , Krishna Sayana
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-Si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-Si
- Main IPC: H04B7/02
- IPC: H04B7/02 ; H04L1/00 ; H04B7/06

Abstract:
According to one embodiment, a subscriber station configured to communicate with one or more base stations in a wireless communication network. The subscriber station is configured to receive, from the network, information associated with one or more of the TPs that are candidates for coordinated multipoint (CoMP) transmission with the subscriber station, measure a plurality of channel quality values for each of the one or more TPs, and report to the network, the measured channel quality values.
Public/Granted literature
- US20130077513A1 CoMP MEASUREMENT SYSTEM AND METHOD Public/Granted day:2013-03-28
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