Invention Grant
- Patent Title: Raman spectrum measuring method for drug inspection
- Patent Title (中): 用于药物检查的拉曼光谱测量方法
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Application No.: US14495233Application Date: 2014-09-24
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Publication No.: US09250180B2Publication Date: 2016-02-02
- Inventor: Zhiqiang Chen , Li Zhang , Jianhong Zhang , Hongqiu Wang , Ziran Zhao , Yumin Yi , Jianping Gu , Qingping Huang
- Applicant: Nuctech Company Limited , Tsinghua University
- Applicant Address: CN Beijing
- Assignee: Nuctech Company Limited
- Current Assignee: Nuctech Company Limited
- Current Assignee Address: CN Beijing
- Agency: Knobbe, Martens, Olson & Bear, LLP
- Priority: CN201310446679 20130925
- Main IPC: G01J3/44
- IPC: G01J3/44 ; G01N21/47 ; G01N33/15 ; G01N21/65

Abstract:
A raman spectrum measuring method for drug inspection is provided, comprising: measuring raman spectrum of a sample to be inspected to acquire an original raman spectrum curve of the sample; determining whether the original raman spectrum curve has a characterizing portion, and if not, measuring a mixture of the sample and an enhancing agent to acquire an enhanced raman spectrum curve of the sample; and if the original raman spectrum curve of the sample to be inspected has a characterizing portion, comparing the original raman spectrum curve of the sample with data in an original raman spectrum database of a drug to determine whether the sample contains the drug, otherwise, comparing the enhanced raman spectrum curve of the sample with data in an enhanced raman spectrum database of the drug to determine whether the sample to be inspected contains the drug.
Public/Granted literature
- US20150085278A1 RAMAN SPECTRUM MEASURING METHOD FOR DRUG INSPECTION Public/Granted day:2015-03-26
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