Invention Grant
- Patent Title: Capacitive test device and method for capacitive testing a component
- Patent Title (中): 电容测试装置和电容测试方法
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Application No.: US13544852Application Date: 2012-07-09
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Publication No.: US09250293B2Publication Date: 2016-02-02
- Inventor: Ming Xue , Weng Yew Kok
- Applicant: Ming Xue , Weng Yew Kok
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Slater & Matsil, L.L.P.
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R31/312 ; G01R1/07
Abstract:
A system and a method for capacitive testing a component (including a packaged component) are disclosed. An embodiment of a test head comprises a holding unit configured to pick-up, hold and release the component, an electrode configured to receive a capacitive signal from the component and a preamplifier configured to amplify the capacitive signal.
Public/Granted literature
- US20140009181A1 Capacitive Test Device and Method for Capacitive Testing a Component Public/Granted day:2014-01-09
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