Invention Grant
- Patent Title: Method for making three dimensional memory array architecture using phase change and ovonic switching materials
- Patent Title (中): 使用相变和二次开关材料制作三维存储阵列结构的方法
-
Application No.: US14470247Application Date: 2014-08-27
-
Publication No.: US09252362B2Publication Date: 2016-02-02
- Inventor: Federico Pio
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Brooks, Cameron & Huebsch, PLLC
- Main IPC: H01L45/00
- IPC: H01L45/00 ; H01L27/10 ; H01L27/24 ; H01L27/06

Abstract:
Three dimension memory arrays and methods of forming the same are provided. An example three dimension memory array can include a stack comprising a plurality of first conductive lines separated from one another by at least an insulation material, and at least one conductive extension arranged to extend substantially perpendicular to the plurality of first conductive lines, such that the at least one conductive extension intersects a portion of at least one of the plurality of first conductive lines. Storage element material is formed around the at least one conductive extension. Cell select material is formed around the at least one conductive extension.
Public/Granted literature
- US20150044849A1 THREE DIMENSIONAL MEMORY ARRAY ARCHITECTURE Public/Granted day:2015-02-12
Information query
IPC分类: