Invention Grant
- Patent Title: System for measuring light intensity distribution
- Patent Title (中): 用于测量光强分布的系统
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Application No.: US13729279Application Date: 2012-12-28
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Publication No.: US09255838B2Publication Date: 2016-02-09
- Inventor: Kai-Li Jiang , Jun Zhu , Chen Feng , Shou-Shan Fan
- Applicant: Kai-Li Jiang , Jun Zhu , Chen Feng , Shou-Shan Fan
- Applicant Address: CN Beijing TW New Taipei
- Assignee: Tsinghua University,HON HAI PRECISION INDUSTRY CO., LTD.
- Current Assignee: Tsinghua University,HON HAI PRECISION INDUSTRY CO., LTD.
- Current Assignee Address: CN Beijing TW New Taipei
- Agency: Novak Druce Connolly Bove + Quigg LLP
- Priority: CN201210192085 20120612
- Main IPC: G01J1/02
- IPC: G01J1/02 ; G01J1/58 ; G01J1/42

Abstract:
A system for measuring intensity distribution of light includes a carbon nanotube array and an imaging element. The carbon nanotube array is placed in an environment of inert gas or a vacuum environment. The carbon nanotube array absorbs photons of a light source and radiates radiation light. The imaging element is used to image the radiation light. The carbon nanotube array is between the light source and the imaging element.
Public/Granted literature
- US20130329220A1 SYSTEM FOR MEASURING LIGHT INTENSITY DISTRIBUTION Public/Granted day:2013-12-12
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