Invention Grant
- Patent Title: Heterogeneous channel material integration into wafer
- Patent Title (中): 异质通道材料集成到晶圆
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Application No.: US14064944Application Date: 2013-10-28
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Publication No.: US09257407B2Publication Date: 2016-02-09
- Inventor: Stanley Seungchul Song , Choh Fei Yeap , Zhongze Wang , Niladri Narayan Mojumder
- Applicant: QUALCOMM Incorporated
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM INCORPORATED
- Current Assignee: QUALCOMM INCORPORATED
- Current Assignee Address: US CA San Diego
- Agency: Seyfarth Shaw LLP
- Main IPC: H01L27/092
- IPC: H01L27/092 ; H01L23/00 ; H01L23/528 ; H01L29/267 ; H01L21/822 ; H01L21/8258 ; H01L27/06 ; H01L21/762

Abstract:
Methods for integrating heterogeneous channel material into a semiconductor device, and semiconductor devices that integrate heterogeneous channel material. A method for fabricating a semiconductor device includes processing a first substrate of a first material at a first thermal budget to fabricate a p-type device. The method further includes coupling a second substrate of a second material to the first substrate. The method also includes processing the second substrate to fabricate an n-type device at a second thermal budget that is less than the first thermal budget. The p-type device and the n-type device may cooperate to form a complementary device.
Public/Granted literature
- US20150115473A1 HETEROGENEOUS CHANNEL MATERIAL INTEGRATION INTO WAFER Public/Granted day:2015-04-30
Information query
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