Invention Grant
- Patent Title: Microscope system and method for measuring refractive index of sample
- Patent Title (中): 显微镜系统和测量样品折射率的方法
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Application No.: US14315221Application Date: 2014-06-25
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Publication No.: US09261458B2Publication Date: 2016-02-16
- Inventor: Shingo Tamano
- Applicant: OLYMPUS CORPORATION
- Applicant Address: JP Tokyo
- Assignee: OLYMPUS CORPORATION
- Current Assignee: OLYMPUS CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Holtz, Holtz & Volek PC
- Priority: JP2013-143905 20130709
- Main IPC: G01N21/41
- IPC: G01N21/41 ; G02B21/00 ; G02B21/02 ; G02B21/14 ; G02B26/06

Abstract:
A microscope system includes: a wavefront modulator that modulates a wavefront of light from a light source; an objective that irradiates a sample with light whose wavefront has been modulated by the wavefront modulator; a spherical aberration corrector that corrects spherical aberration caused by a difference between a refractive index of a medium between the objective and the sample and a refractive index of the sample; a refractive index calculator that calculates, for each wavelength of the light from the light source, an average refractive index of a medium between the objective and a condensing position of light emitted from the objective on the basis of an amount of the corrected spherical aberration; and a controller that controls the wavefront modulator to correct chromatic aberration calculated on the basis of the calculated average refractive index for each wavelength.
Public/Granted literature
- US20150015871A1 MICROSCOPE SYSTEM AND METHOD FOR MEASURING REFRACTIVE INDEX OF SAMPLE Public/Granted day:2015-01-15
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