Laser microscope
    1.
    发明授权

    公开(公告)号:US10317659B2

    公开(公告)日:2019-06-11

    申请号:US15613101

    申请日:2017-06-02

    Inventor: Shingo Tamano

    Abstract: A laser microscope 1 includes: a filter unit 18, which is a fluorescence-splitting mechanism that splits the fluorescence generated by the specimen S and the excitation light according to a wavelength, and that changes a wavelength at which light is split; a diffraction grating 22 that disperses the fluorescence split by the filter unit 18; a mirror 23 that changes a wavelength of fluorescence that is detected by a PMT 26 and that is dispersed by the diffraction grating 22; and a control unit 30 that controls the filter unit 18. The control unit 30 performs control to change a wavelength at which the filter unit 18 splits light in accordance with a change in the wavelength of the fluorescence that is detected by the PMT 26 and that is dispersed by the diffraction grating 22, the change being performed by the mirror 23.

    Observation apparatus and objective

    公开(公告)号:US10890744B2

    公开(公告)日:2021-01-12

    申请号:US16423801

    申请日:2019-05-28

    Inventor: Shingo Tamano

    Abstract: An observation apparatus includes: alight source that emits pulsed light; and an objective that includes a first optical element serving as a light guide part and irradiates a sample with the pulsed light. The first optical element consists of a medium that satisfies the following conditional expression for θ1 and θ2: 0.75

    Scanning microscope
    3.
    发明授权

    公开(公告)号:US10107999B2

    公开(公告)日:2018-10-23

    申请号:US15230213

    申请日:2016-08-05

    Inventor: Shingo Tamano

    Abstract: A scanning microscope includes: a varifocal lens that scans an object in an optical-axis direction of an objective; a scanner that scans the object in a direction orthogonal to the optical axis of the objective; and a controller configured to control the varifocal lens and the scanner.

    Microscope apparatus
    4.
    发明授权

    公开(公告)号:US09977155B2

    公开(公告)日:2018-05-22

    申请号:US14823425

    申请日:2015-08-11

    Inventor: Shingo Tamano

    CPC classification number: G02B3/08 G02B21/002 G02B21/02 G02B21/06 G02B21/16

    Abstract: A microscope apparatus includes an objective and a photodetector, and projects a pupil of the objective onto a light-receiving surface of the photodetector. The microscope apparatus further includes an optical element that is arranged between the objective and the photodetector. The optical element has a plurality of refractive surfaces which are arranged in a direction orthogonal to an optical axis of the optical element and to which light fluxes emitted from the pupil of the objective at different angles are incident.

    Scanning microscope
    5.
    发明授权

    公开(公告)号:US10775598B2

    公开(公告)日:2020-09-15

    申请号:US16167103

    申请日:2018-10-22

    Inventor: Shingo Tamano

    Abstract: A scanning microscope includes a laser configured to emit laser light, an objective configured to focus the laser light on an object, a scanner configured to scan the object in a direction orthogonal to an optical axis of the objective, a varifocal lens configured to scan the object in an optical-axis direction of the objective by changing a lens shape of the varifocal lens, a first relay lens configured to project the scanner onto the varifocal lens, a second relay lens configured to project a pupil of the objective onto the varifocal lens, a photodetector configured to detect fluorescence generated from the object upon the laser light being focused on the object by the objective, and a dichroic mirror configured to separate the fluorescence and the laser light emitted from the laser from each other. The varifocal lens is located between the objective and the scanner.

    Scanning microscope having focal position adjustment unit which includes a deflecting element

    公开(公告)号:US09983396B2

    公开(公告)日:2018-05-29

    申请号:US14543394

    申请日:2014-11-17

    Inventor: Shingo Tamano

    Abstract: A scanning microscope includes a collecting lens that takes in a detection light, a focal position adjustment unit that moves in an optical axis direction of the collecting lens to make the collecting lens move in the optical axis direction, a detector positioned at a location that is optically conjugate to a pupil of the collecting lens, and a relay optical system that relays the pupil to the detector. The relay optical system includes a first optical element with a positive power, the first optical element being positioned in the focal position adjustment unit and converting the detection light that was converted by the collecting lens into a parallel light flux, into a convergent light flux to be emitted outside of the focal position adjustment unit, and a second optical element that is positioned outside of the focal position adjustment unit and between the detector and the first optical element.

    Scanning optical microscope
    7.
    发明授权
    Scanning optical microscope 有权
    扫描光学显微镜

    公开(公告)号:US09261689B2

    公开(公告)日:2016-02-16

    申请号:US14298707

    申请日:2014-06-06

    Abstract: A scanning optical microscope includes a light source, a light converging optical system, a stage, a scanning unit which displaces an illumination light and the stage relatively, a detecting optical system, and a photodetector. A light modulation element and a relay optical system are disposed on the light converging optical system side of the light source, and a modulated signal having only amplitude changed is input to the light modulation element, and the light modulation element is positioned such that the illumination light emerged from the light modulation element with respect to the modulated signal of a predetermined amplitude coincides with an optical axis of the light converging optical system, and a position of a pupil of the light converging optical system and a position of the light modulation element are conjugate through at least the relay optical system.

    Abstract translation: 扫描光学显微镜包括光源,聚光光学系统,舞台,相对地移动照明光和舞台的扫描单元,检测光学系统和光电检测器。 光调制元件和中继光学系统设置在光源的聚光光学系统侧,并且只有振幅改变的调制信号被输入到光调制元件,并且光调制元件被定位成使得照明 相对于预定幅度的调制信号从光调制元件出射的光与会聚光学系统的光轴重合,会聚光学系统的光瞳位置和光调制元件的位置是 通过至少中继光学系统共轭。

    Microscope system and method for measuring refractive index of sample
    8.
    发明授权
    Microscope system and method for measuring refractive index of sample 有权
    显微镜系统和测量样品折射率的方法

    公开(公告)号:US09261458B2

    公开(公告)日:2016-02-16

    申请号:US14315221

    申请日:2014-06-25

    Inventor: Shingo Tamano

    CPC classification number: G01N21/41 G02B21/02 G02B21/14 G02B26/06

    Abstract: A microscope system includes: a wavefront modulator that modulates a wavefront of light from a light source; an objective that irradiates a sample with light whose wavefront has been modulated by the wavefront modulator; a spherical aberration corrector that corrects spherical aberration caused by a difference between a refractive index of a medium between the objective and the sample and a refractive index of the sample; a refractive index calculator that calculates, for each wavelength of the light from the light source, an average refractive index of a medium between the objective and a condensing position of light emitted from the objective on the basis of an amount of the corrected spherical aberration; and a controller that controls the wavefront modulator to correct chromatic aberration calculated on the basis of the calculated average refractive index for each wavelength.

    Abstract translation: 显微镜系统包括:波前调制器,其调制来自光源的光的波前; 用波前调制器调制波前的光照射样本的目标; 球面像差校正器,其校正由物镜和样品之间的介质的折射率与样品的折射率之间的差引起的球面像差; 折射率计算器,对于来自所述光源的光的每个波长,根据校正的球面像差的量,计算从所述物镜发射的物体与所述物体的聚光位置之间的介质的平均折射率; 以及控制器,其控制波前调制器以校正基于每个波长的计算的平均折射率计算的色差。

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