Invention Grant
- Patent Title: Memory devices facilitating differing depths of error detection and/or error correction coverage
- Patent Title (中): 存储器件有助于不同深度的错误检测和/或纠错覆盖
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Application No.: US14059057Application Date: 2013-10-21
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Publication No.: US09262261B2Publication Date: 2016-02-16
- Inventor: William H. Radke
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dicke, Billig & Czaja, PLLC
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G06F11/10 ; B32B25/08 ; B32B27/08 ; G11C29/04 ; F16L11/04
Abstract:
Memory devices facilitating differing depths of error detection and/or error correction coverage for differing portions of a memory array.
Public/Granted literature
- US20140047298A1 MEMORY DEVICES FACILITATING DIFFERING DEPTHS OF ERROR DETECTION AND/OR ERROR CORRECTION COVERAGE Public/Granted day:2014-02-13
Information query
