In a multilayer ceramic capacitor, an inner ceramic layer includes a perovskite-type compound containing Ba and Ti. A region within an electrically effective portion of the inner ceramic layers sandwiched between inner electrodes, which is near an area where inner and outer electrodes connect to each other, is subjected to a mapping analysis using EDS. ((L2−L3)/L1)×100≧50 is satisfied, L1 denotes a total length of ceramic grain boundaries detected from a TEM transmission image, L2 denotes a total length of grain boundaries, detected from a mapping image and the TEM transmission image, where the rare earth element is present, and L3 denotes a total length of portions, detected from a mapping image and the TEM transmission image, in which the grain boundaries where the rare earth element is present and grain boundaries where at least one of Mn, Mg, and Si is present are overlapped.