发明授权
- 专利标题: Sample testing apparatus
- 专利标题(中): 样品检测仪
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申请号: US12823833申请日: 2010-06-25
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公开(公告)号: US09268914B2公开(公告)日: 2016-02-23
- 发明人: Yuichi Hamada , Masaharu Shibata , Daigo Fukuma
- 申请人: Yuichi Hamada , Masaharu Shibata , Daigo Fukuma
- 申请人地址: JP Kobe
- 专利权人: SYSMEX CORPORATION
- 当前专利权人: SYSMEX CORPORATION
- 当前专利权人地址: JP Kobe
- 代理机构: Brinks Gilson & Lione
- 优先权: JP2009-156257 20090630
- 主分类号: G06F17/40
- IPC分类号: G06F17/40 ; G06F19/00
摘要:
A sample testing apparatus comprising: a first storing section for storing identification information of an operator in association with first or second attribute information; an identification information receiving section for receiving an input of the identification information of the operator; a testing section for obtaining a test result by testing a sample; a second storing section for storing the test result of the sample so as to be linked with the received identification information; an operation end instruction receiving section for receiving an operation end instruction by the operator; and a deleting section for deleting from the second storing section the test result which is stored so as to be linked with the identification information received by the identification information receiving section in the case in which the received identification information is associated with the second attribute information when the operation end instruction is received.
公开/授权文献
- US20100332191A1 SAMPLE TESTING APPARATUS 公开/授权日:2010-12-30
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