Invention Grant
US09269700B2 Stacked semiconductor die assemblies with improved thermal performance and associated systems and methods
有权
具有改进的热性能和相关系统和方法的堆叠式半导体管芯组件
- Patent Title: Stacked semiconductor die assemblies with improved thermal performance and associated systems and methods
- Patent Title (中): 具有改进的热性能和相关系统和方法的堆叠式半导体管芯组件
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Application No.: US14231101Application Date: 2014-03-31
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Publication No.: US09269700B2Publication Date: 2016-02-23
- Inventor: Michel Koopmans , Shijian Luo , David R. Hembree
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee Address: US ID Boise
- Agency: Perkins Cole LLP
- Main IPC: H01L23/02
- IPC: H01L23/02 ; H01L25/18 ; H01L23/34 ; H01L23/00 ; H01L25/00

Abstract:
Stacked semiconductor die assemblies with improved thermal performance and associated systems and methods are disclosed herein. In one embodiment, a semiconductor die assembly can include a stack of semiconductor dies and a thermally conductive casing at least partially enclosing the stack of semiconductor dies within an enclosure. A package substrate carries the thermally conductive casing, and an interposer is disposed between the thermally conductive casing and the stack of semiconductor dies. A peripheral portion of the interposer extends laterally beyond the stack of semiconductor dies and is coupled to a plurality of conductive members interposed between the peripheral portion and the package substrate.
Public/Granted literature
Information query
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