Invention Grant
- Patent Title: Method and apparatus for determining object characteristics
- Patent Title (中): 用于确定物体特性的方法和装置
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Application No.: US14374157Application Date: 2013-01-24
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Publication No.: US09274024B2Publication Date: 2016-03-01
- Inventor: Martin James Humphry , Kevin Langley , James Russell , Andrew Michael Maiden
- Applicant: PHASE FOCUS LIMITED
- Applicant Address: GB Sheffield, South Yorkshire
- Assignee: PHASE FOCUS LIMITED
- Current Assignee: PHASE FOCUS LIMITED
- Current Assignee Address: GB Sheffield, South Yorkshire
- Agency: MH2 Technology Law Group, LLP
- Priority: GB1201140.9 20120124
- International Application: PCT/GB2013/050155 WO 20130124
- International Announcement: WO2013/110941 WO 20130801
- Main IPC: G01B9/00
- IPC: G01B9/00 ; G01M11/02 ; G01B11/24 ; G01B11/06 ; G01N21/41

Abstract:
Embodiments of the invention provide a method of determining one or more characteristics of a target object, comprising determining a first phase map for at least a region of a target object based on radiation directed toward the target object, determining one or more further phase maps for a sub-region of the region of the target object, determining a number of phase wraps for the sub-region based on a plurality of phase maps for the sub-region, and determining a characteristic of the region of the target object based on the number of phase wraps for sub-region and the first phase map. Embodiments of the invention also relate to a method of determining one or more characteristics of a target object, comprising determining a phase map for at least a region of a target object based on one or more diffraction patterns, determining a wavefront at a plane of the object based upon the phase map, and determining a refractive property of the object based on the wavefront.
Public/Granted literature
- US20140368812A1 METHOD AND APPARATUS FOR DETERMINING OBJECT CHARACTERISTICS Public/Granted day:2014-12-18
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