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公开(公告)号：US20160138999A1
公开(公告)日：2016-05-19
申请号：US15001887
申请日：2016-01-20
Applicant: PHASE FOCUS LIMITED
Inventor： Martin James Humphry , Kevin Langley , James Russell , Andrew Michael Maiden
CPC classification number: G01M11/0235 , G01B11/06 , G01B11/24 , G01M11/0228 , G01M11/025 , G01M11/08 , G01N21/41 , G01N2201/12
Abstract: Embodiments of the invention provide a method of determining one or more characteristics of a target object, comprising recording one or more diffraction patterns at a detector, wherein each diffraction pattern is formed by a target object scattering incident radiation, determining a phase map for at least a region of the target object based on the one or more diffraction patterns, and determining a refractive property of the target object based on the phase map.
Abstract translation: 本发明的实施例提供了一种确定目标物体的一个或多个特征的方法，包括在检测器处记录一个或多个衍射图案，其中每个衍射图案由目标物体散射入射辐射形成，至少确定相位图 基于一个或多个衍射图案的目标物体的区域，以及基于相位图确定目标物体的折射特性。
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公开(公告)号：US09784640B2
公开(公告)日：2017-10-10
申请号：US15001887
申请日：2016-01-20
Applicant: PHASE FOCUS LIMITED
Inventor： Martin James Humphry , Kevin Langley , James Russell , Andrew Michael Maiden
CPC classification number: G01M11/0235 , G01B11/06 , G01B11/24 , G01M11/0228 , G01M11/025 , G01M11/08 , G01N21/41 , G01N2201/12
Abstract: Embodiments of the invention provide a method of determining one or more characteristics of a target object, comprising recording one or more diffraction patterns at a detector, wherein each diffraction pattern is formed by a target object scattering incident radiation, determining a phase map for at least a region of the target object based on the one or more diffraction patterns, and determining a refractive property of the target object based on the phase map.
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公开(公告)号：US09274024B2
公开(公告)日：2016-03-01
申请号：US14374157
申请日：2013-01-24
Applicant: PHASE FOCUS LIMITED
Inventor： Martin James Humphry , Kevin Langley , James Russell , Andrew Michael Maiden
CPC classification number: G01M11/0235 , G01B11/06 , G01B11/24 , G01M11/0228 , G01M11/025 , G01M11/08 , G01N21/41 , G01N2201/12
Abstract: Embodiments of the invention provide a method of determining one or more characteristics of a target object, comprising determining a first phase map for at least a region of a target object based on radiation directed toward the target object, determining one or more further phase maps for a sub-region of the region of the target object, determining a number of phase wraps for the sub-region based on a plurality of phase maps for the sub-region, and determining a characteristic of the region of the target object based on the number of phase wraps for sub-region and the first phase map. Embodiments of the invention also relate to a method of determining one or more characteristics of a target object, comprising determining a phase map for at least a region of a target object based on one or more diffraction patterns, determining a wavefront at a plane of the object based upon the phase map, and determining a refractive property of the object based on the wavefront.
Abstract translation: 本发明的实施例提供了一种确定目标对象的一个或多个特征的方法，包括：基于朝向目标对象的辐射确定目标对象的至少一个区域的第一相位图，确定一个或多个进一步的相位图， 所述目标对象的区域的子区域，基于所述子区域的多个相位图确定所述子区域的相位包数，基于所述子区域的所述区域的特性， 子区域的相位包数和第一相位图。 本发明的实施例还涉及一种确定目标对象的一个或多个特征的方法，包括：基于一个或多个衍射图案来确定目标对象的至少一个区域的相位图，确定目标物体的平面上的波前 基于相位图的对象，以及基于所述波阵面确定所述对象的折射特性。
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公开(公告)号：US20140368812A1
公开(公告)日：2014-12-18
申请号：US14374157
申请日：2013-01-24
Applicant: PHASE FOCUS LIMITED
Inventor： Martin James Humphry , Kevin Langley , James Russell , Andrew Michael Maiden
CPC classification number: G01M11/0235 , G01B11/06 , G01B11/24 , G01M11/0228 , G01M11/025 , G01M11/08 , G01N21/41 , G01N2201/12
Abstract: Embodiments of the invention provide a method of determining one or more characteristics of a target object, comprising determining a first phase map for at least a region of a target object based on radiation directed toward the target object, determining one or more further phase maps for a sub-region of the region of the target object, determining a number of phase wraps for the sub-region based on a plurality of phase maps for the sub-region, and determining a characteristic of the region of the target object based on the number of phase wraps for sub-region and the first phase map. Embodiments of the invention also relate to a method of determining one or more characteristics of a target object, comprising determining a phase map for at least a region of a target object based on one or more diffraction patterns, determining a wavefront at a plane of the object based upon the phase map, and determining a refractive property of the object based on the wavefront.
Abstract translation: 本发明的实施例提供了一种确定目标对象的一个或多个特征的方法，包括：基于朝向目标对象的辐射确定目标对象的至少一个区域的第一相位图，确定一个或多个进一步的相位图， 所述目标对象的区域的子区域，基于所述子区域的多个相位图确定所述子区域的相位包数，基于所述子区域的所述区域的特性， 子区域的相位包数和第一相位图。 本发明的实施例还涉及一种确定目标对象的一个或多个特征的方法，包括：基于一个或多个衍射图案来确定目标对象的至少一个区域的相位图，确定目标物体的平面上的波前 基于相位图的对象，以及基于所述波阵面确定所述对象的折射特性。
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