Invention Grant
- Patent Title: Terahertz spectroscopy system and method
- Patent Title (中): 太赫兹光谱系统和方法
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Application No.: US13212231Application Date: 2011-08-18
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Publication No.: US09279723B2Publication Date: 2016-03-08
- Inventor: John F. Roulston , Daniel Mandelik
- Applicant: John F. Roulston , Daniel Mandelik
- Applicant Address: CH Vaumarcus (NE)
- Assignee: NOVATRANS GROUP SA
- Current Assignee: NOVATRANS GROUP SA
- Current Assignee Address: CH Vaumarcus (NE)
- Agency: Browdy and Neimark, PLLC
- Main IPC: G01B9/02
- IPC: G01B9/02 ; G01J3/45 ; G01J3/42 ; G01J3/10 ; G01J3/433

Abstract:
A terahertz spectrometer includes: a terahertz-wave emitter and a terahertz receiver elements. The terahertz wave generated by means of generating beat frequency corresponding to the difference between two rapidly tunable continuous wave lasers. Having a difference in time between the interrogating signal and the reference signal at the receiver end side, which corresponds to intermediate frequency (IF), not centered around the baseband, i.e. zero Hertz. The offset step size of the intermediate frequency from zero Hertz is linearly correlated to the position of the interrogated object position.
Public/Granted literature
- US20120044479A1 TERAHERTZ SPECTROSCOPY SYSTEM AND METHOD Public/Granted day:2012-02-23
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