Invention Grant
- Patent Title: Systems and methods for ATI characterization
- Patent Title (中): ATI表征的系统和方法
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Application No.: US14148407Application Date: 2014-01-06
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Publication No.: US09281006B2Publication Date: 2016-03-08
- Inventor: Lu Lu , Haitao Xia , Lu Pan , Xiufeng Song
- Applicant: LSI Corporation
- Applicant Address: SG Singapore
- Assignee: Avago Technologies General IP (Singapore) Pte. Ltd.
- Current Assignee: Avago Technologies General IP (Singapore) Pte. Ltd.
- Current Assignee Address: SG Singapore
- Main IPC: G11B20/10
- IPC: G11B20/10
Abstract:
Systems, methods, devices, circuits for data processing, and more particularly to data processing including adjacent track interference detection and/or characterization.
Public/Granted literature
- US20150170706A1 Systems and Methods for ATI Characterization Public/Granted day:2015-06-18
Information query
