Invention Grant
- Patent Title: Systems and methods for revisit location detection
- Patent Title (中): 重新检测位置检测的系统和方法
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Application No.: US14126096Application Date: 2013-06-28
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Publication No.: US09288633B2Publication Date: 2016-03-15
- Inventor: Xue Yang , Lei Yang , Aveek Purohit
- Applicant: INTEL CORPORATION
- Applicant Address: US CA Santa Clara
- Assignee: INTEL CORPORATION
- Current Assignee: INTEL CORPORATION
- Current Assignee Address: US CA Santa Clara
- Agency: Salehi Law Group
- International Application: PCT/US2013/048498 WO 20130628
- International Announcement: WO2014/209344 WO 20141231
- Main IPC: H04W4/04
- IPC: H04W4/04 ; H04W64/00 ; H04W4/02

Abstract:
A method of detecting a revisit position includes receiving at a computing system a plurality of position data points, each of the plurality of position data points including a signal scan measurement. The method farther includes calculating a first signal distance between a first signal scan measurement corresponding to a first position data point of the plurality of position data points and a second signal scan measurement corresponding to a second position data point of the plurality of position data points. The method further includes determining that the first signal distance is less than a first threshold, that the first signal distance is a local minimum for the first position data point, and the first signal distance is a local minimum for the second position data point. The method further includes, based on the determining, identifying the first and second position data points as revisit points.
Public/Granted literature
- US20150172869A1 SYSTEMS AND METHODS FOR REVISIT LOCATION DETECTION Public/Granted day:2015-06-18
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