发明授权
- 专利标题: Thin-film multi-layer micro-wire structure
- 专利标题(中): 薄膜多层微线结构
-
申请号: US14264499申请日: 2014-04-29
-
公开(公告)号: US09288901B2公开(公告)日: 2016-03-15
- 发明人: Roger G. Markham , Ronald Steven Cok , Yongcai Wang , Mitchell Lawrence Wright
- 申请人: Roger G. Markham , Ronald Steven Cok , Yongcai Wang , Mitchell Lawrence Wright
- 申请人地址: US NY Rochester
- 专利权人: EASTMAN KODAK COMPANY
- 当前专利权人: EASTMAN KODAK COMPANY
- 当前专利权人地址: US NY Rochester
- 代理商 Raymond L. Owens; William R. Zimmerli
- 主分类号: H01L33/42
- IPC分类号: H01L33/42 ; H05K1/02 ; H01B1/02 ; H05K3/10 ; H05K3/18
摘要:
A thin-film multi-layer micro-wire structure includes a substrate and a layer located on the substrate or forming a part of the substrate. One or more micro-channels are located in the layer. Each micro-channel has a width less than or equal to 20 microns. A cured electrically conductive micro-wire is located only within each micro-channel. The micro-wire has a thickness less than or equal to 20 microns, including silver nano-particles, and having a percent ratio of silver that is greater than or equal to 40% by weight. An electrolessly plated layer is located at least partially within each micro-channel between the micro-wire and the layer surface and in electrical contact with the micro-wire. The plated layer has a thickness less than a thickness of the micro-wire so that the micro-wire and plated layer form the thin-film multi-layer micro-wire.
公开/授权文献
- US20150313009A1 THIN-FILM MULTI-LAYER MICRO-WIRE STRUCTURE 公开/授权日:2015-10-29
信息查询
IPC分类: