发明授权
- 专利标题: FRET measurement device and FRET measurement method
- 专利标题(中): FRET测量装置和FRET测量方法
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申请号: US14381915申请日: 2013-03-22
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公开(公告)号: US09291563B2公开(公告)日: 2016-03-22
- 发明人: Shigeyuki Nakada , Yusuke Ohba , Kyouji Doi , Yumi Asano
- 申请人: Mitsui Engineering & Shipbuilding Co., Ltd. , NATIONAL UNIVERSITY CORPORATION HOKKAIDO UNIVERSITY
- 申请人地址: JP Tokyo JP Hokkaido
- 专利权人: MITSUI ENGINEERING & SHIPBUILDING,NATIONAL UNIVERSITY CORPORATION HOKKAIDO UNIVERSITY
- 当前专利权人: MITSUI ENGINEERING & SHIPBUILDING,NATIONAL UNIVERSITY CORPORATION HOKKAIDO UNIVERSITY
- 当前专利权人地址: JP Tokyo JP Hokkaido
- 代理机构: Global IP Counselors, LLP
- 优先权: JP2012-065771 20120322
- 国际申请: PCT/JP2013/058325 WO 20130322
- 国际公布: WO2013/141372 WO 20130926
- 主分类号: G01N21/64
- IPC分类号: G01N21/64 ; G01N33/542 ; C12Q1/68
摘要:
FRET measurement uses a FRET probe that includes a probe element X containing a donor fluorescent substance and a probe element Y containing an acceptor fluorescent substance and enables FRET to occur when the probe element X and the probe element Y approach to each other or bind together. The modulation frequency of laser light with which the FRET probe is irradiated is adjusted to an optimum modulation frequency that maximizes a difference between the phase difference of donor fluorescence emitted from the donor fluorescent substance with respect to intensity modulation of the laser light at the time when FRET occurs and the phase difference of donor fluorescence emitted from the donor fluorescent substance with respect to intensity modulation of the laser light at the time when FRET does not occur.
公开/授权文献
- US20150044690A1 FRET MEASUREMENT DEVICE AND FRET MEASUREMENT METHOD 公开/授权日:2015-02-12
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