- 专利标题: ESD protection device with improved bipolar gain using cutout in the body well
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申请号: US13594106申请日: 2012-08-24
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公开(公告)号: US09293460B2公开(公告)日: 2016-03-22
- 发明人: Henry Litzmann Edwards , Akram A. Salman
- 申请人: Henry Litzmann Edwards , Akram A. Salman
- 申请人地址: US TX Dallas
- 专利权人: TEXAS INSTRUMENTS INCORPORATED
- 当前专利权人: TEXAS INSTRUMENTS INCORPORATED
- 当前专利权人地址: US TX Dallas
- 代理商 Jacqueline J. Garner; Frank D. Cimino
- 主分类号: H01L27/092
- IPC分类号: H01L27/092 ; H01L21/8238 ; H01L27/02 ; H01L21/265 ; H01L21/266
摘要:
An integrated circuit includes an NMOS SCR in which a p-type body well of the NMOS transistor provides a base layer for a vertical NPN layer stack. The base layer is formed by implanting p-type dopants using an implant mask which has a cutout mask element over the base area, so as to block the p-type dopants from the base area. The base layer is implanted concurrently with p-type body wells under NMOS transistors in logic components in the integrated circuit. Subsequent anneals cause the p-type dopants to diffuse into the base area, forming a base with a lower doping density that adjacent regions of the body well of the NMOS transistor in the NMOS SCR. The NMOS SCR may have a symmetric transistor, a drain extended transistor, or may be a bidirectional NMOS SCR with a symmetric transistor integrated with a drain extended transistor.
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