Invention Grant
- Patent Title: Test signal generator for low-density parity-check decoder
- Patent Title (中): 用于低密度奇偶校验解码器的测试信号发生器
-
Application No.: US14027371Application Date: 2013-09-16
-
Publication No.: US09294128B2Publication Date: 2016-03-22
- Inventor: Denis Vladimirovich Zaytsev , Ivan Leonidovich Mazurenko , Alexander Alexandrovich Petyushko , Aleksey Alexandrovich Letunovskiy , Pavel Aleksandrovich Aliseitchik , Dmitry Nicolaevich Babin
- Applicant: LSI Corporation
- Applicant Address: SG Singapore
- Assignee: Avago Technologies General IP (Singapore) Pte. Ltd.
- Current Assignee: Avago Technologies General IP (Singapore) Pte. Ltd.
- Current Assignee Address: SG Singapore
- Priority: RU2013108893 20130227
- Main IPC: H03M13/13
- IPC: H03M13/13 ; H03M13/11 ; H03M13/01

Abstract:
A method for estimating error rates in low-density parity check codes includes calibrating an encoder according to specific channel parameters and according to dominant error events in the low-density parity-check code. Dominant codewords are classified based on characteristics of each codeword that are likely to produce similar error rates at similar noise levels; codeword classes that produce the highest error rate are then tested. Error boundary distance is estimated using multiple binary searches on segments. Segments are defined based on codeword, trapping set and biasing noise components of the channel. To improve calculation speed the most significant subclasses of codewords, trapping sets and noise signals are used.
Public/Granted literature
- US20140245086A1 Test Signal Generator for Low-Density Parity-Check Decoder Public/Granted day:2014-08-28
Information query
IPC分类: