Invention Grant
- Patent Title: Indentation test method and indentation test apparatus
- Patent Title (中): 压痕试验方法和压痕试验装置
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Application No.: US13138235Application Date: 2010-01-18
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Publication No.: US09297730B2Publication Date: 2016-03-29
- Inventor: Atsushi Sakuma , Mitsuhiro Tani
- Applicant: Atsushi Sakuma , Mitsuhiro Tani
- Applicant Address: JP Fuchu-Shi
- Assignee: NATIONAL UNIVERSITY CORPORATION TOKYO UNIVERSITY OF AGRICULTURE AND TECHNOLOGY
- Current Assignee: NATIONAL UNIVERSITY CORPORATION TOKYO UNIVERSITY OF AGRICULTURE AND TECHNOLOGY
- Current Assignee Address: JP Fuchu-Shi
- Agency: Masuvalley and Partners
- Priority: JP2009-010426 20090120; JP2009-185525 20090810
- International Application: PCT/JP2010/050499 WO 20100118
- International Announcement: WO2010/084840 WO 20100729
- Main IPC: G01L1/06
- IPC: G01L1/06 ; G01L1/04 ; G06F3/01 ; G06F3/03 ; G01N3/42

Abstract:
A novel indentation test apparatus is provided. The indentation test apparatus is an apparatus for indenting a specimen with a spherical indenter. The indentation test apparatus includes a specimen thickness identifier) that identifies the thickness of the specimen, an equivalent indentation strain calculator that calculates equivalent indentation strain of the specimen by using the thickness of the specimen, and a Young's modulus calculator that calculates Young's modulus of the specimen by using the equivalent indentation strain. Young's modulus E of the specimen preferably ranges from 100 Pa to 100 MPa. The diameter of the spherical indenter preferably ranges from 1×10−8 to 1 m.
Public/Granted literature
- US20120022802A1 INDENTATION TEST METHOD AND INDENTATION TEST APPARATUS Public/Granted day:2012-01-26
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