Invention Grant
- Patent Title: Shape measuring apparatus
- Patent Title (中): 形状测量仪
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Application No.: US13893864Application Date: 2013-05-14
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Publication No.: US09298178B2Publication Date: 2016-03-29
- Inventor: Takashi Noda , Hiromi Deguchi
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JP2012-113596 20120517
- Main IPC: G05B19/18
- IPC: G05B19/18 ; G05B19/04 ; G01B21/04 ; G05B19/401

Abstract:
A shape measuring apparatus includes: a probe having a stylus tip; a movable mechanism configured to move the stylus tip; an information acquiring unit configured to acquire design information of a workpiece; a path setting unit configured to set a path of the stylus tip; a path component calculating section configured to calculate a path velocity vector; a push direction component calculating section configured to detect a deflection, and calculate a push correction vector; a locus correction component calculating section configured to detect an amount and a direction of locus deviation of the probe from the path, and calculate a locus correction vector; a velocity synthesizing section configured to calculate a velocity synthesis vector by combining the path velocity vector, the push correction vector, and the locus correction vector; and a drive control unit configured to move the probe according to the velocity synthesis vector.
Public/Granted literature
- US20130310962A1 SHAPE MEASURING APPARATUS Public/Granted day:2013-11-21
Information query
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