Invention Grant
- Patent Title: Apparatus and method for generating bill of materials for inspection
- Patent Title (中): 用于生成检验材料清单的设备和方法
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Application No.: US13906731Application Date: 2013-05-31
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Publication No.: US09299048B2Publication Date: 2016-03-29
- Inventor: Tien-Chin Fang , Jhen-Jhong Chen , Yao-Kun Lee , Chen-Chung Lee , Ping-Chi Lai , Ching-Shium Chen
- Applicant: Quanta Computer Inc.
- Applicant Address: TW Tao Yuan Shien
- Assignee: QUANTA COMPUTER INC.
- Current Assignee: QUANTA COMPUTER INC.
- Current Assignee Address: TW Tao Yuan Shien
- Agency: Rabin & Berdo, P.C.
- Priority: TW102104338A 20130205
- Main IPC: G06Q10/00
- IPC: G06Q10/00 ; G06Q10/06

Abstract:
An apparatus and a method for generating a bill of materials for inspection are disclosed. The apparatus for generating a bill of materials for inspection comprises a risk operation module, a data filtering module, and a data outputting module. The risk operation module selects a material risk index, a manufacturer risk index, a laboratory risk index corresponding to a material from the risk database, and decides the risk level according to the material risk index, the manufacturer risk index, and the laboratory risk index. The data filtering module determines whether a material needs to be inspected according to the risk level. The data outputting module selects a material sample from the material, and adds the material sample to the bill of materials for inspection.
Public/Granted literature
- US20140222185A1 APPARATUS AND METHOD FOR GENERATING BILL OF MATERIALS FOR INSPECTION Public/Granted day:2014-08-07
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