发明授权
- 专利标题: Methods of forming vertical cell semiconductor devices with single-crystalline channel structures
- 专利标题(中): 用单晶通道结构形成垂直单元半导体器件的方法
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申请号: US14272237申请日: 2014-05-07
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公开(公告)号: US09318329B2公开(公告)日: 2016-04-19
- 发明人: Kanamori Kohji , Young-Woo Park , Jin-Taek Park , Jae-Duk Lee
- 申请人: Kanamori Kohji , Young-Woo Park , Jin-Taek Park , Jae-Duk Lee
- 申请人地址: KR
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR
- 代理机构: Myers Bigel & Sibley, P.A.
- 优先权: KR10-2013-0075821 20130628
- 主分类号: H01L21/02
- IPC分类号: H01L21/02 ; H01L21/28 ; H01L27/115 ; H01L29/66 ; H01L29/792
摘要:
Methods of fabricating a vertical cell semiconductor device including forming a hole passing through a stacked structure of alternating insulating and sacrificial layers on a substrate, forming an amorphous silicon layer conforming to an inner wall of the hole, forming a silicon region on the amorphous silicon layer, and metal induced crystallizing the amorphous silicon layer via the silicon region to form a single-crystalline channel structure in the hole.
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