Invention Grant
- Patent Title: Storage media asperity characterization
- Patent Title (中): 存储介质粗糙度表征
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Application No.: US13627731Application Date: 2012-09-26
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Publication No.: US09335153B2Publication Date: 2016-05-10
- Inventor: Robert Matousek , Kevin David Powers , Dale Thomas Riley
- Applicant: Seagate Technology LLC
- Applicant Address: US CA Cupertino
- Assignee: SEAGATE TECHNOLOGY LLC
- Current Assignee: SEAGATE TECHNOLOGY LLC
- Current Assignee Address: US CA Cupertino
- Agency: HolzerIPLaw, PC
- Main IPC: G01B7/34
- IPC: G01B7/34 ; G11B27/36 ; G11B5/60

Abstract:
The present application discloses detecting an asperity on a storage media surface using two amplitude threshold crossings of an asperity detection signal within a preset timing window. The present application further discloses a temperature-dependent resistive asperity sensor and a preamplifier that correlates a resistance change at the asperity sensor within a preset timing window to detect an asperity on a storage media surface. The asperity may be one or both of a void in the storage media surface and a protrusion from the storage media surface.
Public/Granted literature
- US20140086034A1 STORAGE MEDIA ASPERITY CHARACTERIZATION Public/Granted day:2014-03-27
Information query