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公开(公告)号：US09335153B2
公开(公告)日：2016-05-10
申请号：US13627731
申请日：2012-09-26
Applicant: Seagate Technology LLC
Inventor： Robert Matousek , Kevin David Powers , Dale Thomas Riley
CPC classification number: G01B7/34 , G11B5/607 , G11B5/6076 , G11B27/36
Abstract: The present application discloses detecting an asperity on a storage media surface using two amplitude threshold crossings of an asperity detection signal within a preset timing window. The present application further discloses a temperature-dependent resistive asperity sensor and a preamplifier that correlates a resistance change at the asperity sensor within a preset timing window to detect an asperity on a storage media surface. The asperity may be one or both of a void in the storage media surface and a protrusion from the storage media surface.
Abstract translation: 本申请公开了使用预设定时窗口内的粗糙度检测信号的两个振幅阈值交叉来检测存储介质表面上的粗糙度。 本申请还公开了一种温度依赖性电阻粗糙度传感器和一个前置放大器，其将预定定时窗口内的凹凸传感器的电阻变化相关联，以检测存储介质表面上的粗糙度。 凹凸可以是存储介质表面中的空隙和来自存储介质表面的突起中的一个或两个。
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公开(公告)号：US20140086034A1
公开(公告)日：2014-03-27
申请号：US13627731
申请日：2012-09-26
Applicant: SEAGATE TECHNOLOGY LLC
Inventor： Robert Matousek , Kevin David Powers , Dale Thomas Riley
IPC: G11B27/36
CPC classification number: G01B7/34 , G11B5/607 , G11B5/6076 , G11B27/36
Abstract: The present application discloses detecting an asperity on a storage media surface using two amplitude threshold crossings of an asperity detection signal within a preset timing window. The present application further discloses a temperature-dependent resistive asperity sensor and a preamplifier that correlates a resistance change at the asperity sensor within a preset timing window to detect an asperity on a storage media surface. The asperity may be one or both of a void in the storage media surface and a protrusion from the storage media surface.
Abstract translation: 本申请公开了使用预设定时窗口内的粗糙度检测信号的两个振幅阈值交叉来检测存储介质表面上的粗糙度。 本申请还公开了一种温度依赖性电阻粗糙度传感器和一个前置放大器，其将预定定时窗口内的凹凸传感器的电阻变化相关联，以检测存储介质表面上的粗糙度。 凹凸可以是存储介质表面中的空隙和来自存储介质表面的突起中的一个或两个。
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公开(公告)号：US20140085745A1
公开(公告)日：2014-03-27
申请号：US13627763
申请日：2012-09-26
Applicant: SEAGATE TECHNOLOGY LLC
Inventor： Kevin David Powers , Sandeep Bhushan , James J. Martin , Prasanna Manja Ramakrishna , Dale Thomas Riley , Vance Charles Kluver , Scott Howard Deits
CPC classification number: G11B5/6076 , G11B5/40 , G11B5/607
Abstract: The present application discloses a transducer head comprising a read element that reads data from a storage media and an asperity sensor that detects a dimension of an asperity on a surface of the storage media using a temperature change at the asperity sensor. The asperity may be one or both of a void in the surface of the storage media and a protrusion from the surface of the storage media.
Abstract translation: 本申请公开了一种换能器头，其包括从存储介质读取数据的读取元件和使用在凹凸传感器处的温度变化来检测存储介质的表面上的凹凸的尺寸的粗糙度传感器。 凹凸可以是存储介质的表面中的空隙和从存储介质的表面的突起中的一个或两个。
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公开(公告)号：US08681438B1
公开(公告)日：2014-03-25
申请号：US13627763
申请日：2012-09-26
Applicant: Seagate Technology LLC
Inventor： Kevin David Powers , Sandeep Bhushan , James J. Martin , Prasanna Manja Ramakrishna , Dale Thomas Riley , Vance Charles Kluver , Scott Howard Deits
IPC: G11B5/02
CPC classification number: G11B5/6076 , G11B5/40 , G11B5/607
Abstract: The present application discloses a transducer head comprising a read element that reads data from a storage media and an asperity sensor that detects a dimension of an asperity on a surface of the storage media using a temperature change at the asperity sensor. The asperity may be one or both of a void in the surface of the storage media and a protrusion from the surface of the storage media.
Abstract translation: 本申请公开了一种换能器头，其包括从存储介质读取数据的读取元件和使用在凹凸传感器处的温度变化来检测存储介质的表面上的凹凸的尺寸的粗糙度传感器。 凹凸可以是存储介质的表面中的空隙和从存储介质的表面的突起中的一个或两个。
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