Invention Grant
- Patent Title: Spectral-domain interferometric method and system for characterizing terahertz radiation
- Patent Title (中): 用于表征太赫兹辐射的光谱域干涉法和系统
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Application No.: US14417968Application Date: 2013-08-01
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Publication No.: US09335213B2Publication Date: 2016-05-10
- Inventor: Gargi Sharma , Kanwarpal Singh , Roberto Morandotti , Tsuneyuki Ozaki
- Applicant: INSTITUT NATIONAL DE LA RECHERCHE SCIENTIFIQUE
- Applicant Address: CA Quebec
- Assignee: INSTITUT NATIONAL DE LA RECHERCHE SCIENTIFIQUE
- Current Assignee: INSTITUT NATIONAL DE LA RECHERCHE SCIENTIFIQUE
- Current Assignee Address: CA Quebec
- Agency: Goudreau Gage Dubuc
- Agent Gwendoline Bruneau
- International Application: PCT/CA2013/050596 WO 20130801
- International Announcement: WO2014/019091 WO 20140206
- Main IPC: G01J3/45
- IPC: G01J3/45 ; G01J11/00 ; G01J3/10 ; G01J3/453
Abstract:
A method and system based on spectral domain interferometry for detecting intense THz electric field, allowing the use of thick crystal for spectroscopic purposes, in order to makes long temporal scans for increased spectral resolutions, and overcoming the limitation of over-rotation for presently available high power THz sources. Using this method and system the phase difference of approximately 8898π can be measured, which is 18000 times higher than the phase difference measured by electro-optic sampling (π/2).
Public/Granted literature
- US20150192467A1 SPECTRAL-DOMAIN INTERFEROMETRIC METHOD AND SYSTEM FOR CHARACTERIZING TERAHERTZ RADIATION Public/Granted day:2015-07-09
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