According to one embodiment, the system for inspecting a cell substrate is provided. The inspection system includes: a signal generator transmitting to a cell substrate a display signal causing the cell substrate to display a test image; an imaging apparatus capturing the test image displayed on the cell substrate; a parallax image generator arranging the set of parallax image information of the captured test image for each parallax image to generate a parallax image prediction of parallax image which is obtained when the cell substrate is bonded to the lenticular lens; and an interface apparatus displaying the parallax image predictions.