Invention Grant
US09343672B2 Nonvolatile memory devices, nonvolatile memory cells and methods of manufacturing nonvolatile memory devices
有权
非易失性存储器件,非易失性存储器单元以及制造非易失性存储器件的方法
- Patent Title: Nonvolatile memory devices, nonvolatile memory cells and methods of manufacturing nonvolatile memory devices
- Patent Title (中): 非易失性存储器件,非易失性存储器单元以及制造非易失性存储器件的方法
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Application No.: US13442595Application Date: 2012-04-09
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Publication No.: US09343672B2Publication Date: 2016-05-17
- Inventor: Chan-Jin Park , Sun-Jung Kim , Soon-Oh Park , Hyun-Su Ju , Soo-Doo Chae
- Applicant: Chan-Jin Park , Sun-Jung Kim , Soon-Oh Park , Hyun-Su Ju , Soo-Doo Chae
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2011-0054706 20110607; KR10-2011-0146159 20111229
- Main IPC: H01L45/00
- IPC: H01L45/00 ; H01L27/24

Abstract:
A nonvolatile memory cell includes first and second interlayer insulating films which are separated from each other and are stacked sequentially, a first electrode which penetrates the first interlayer insulating film and the second interlayer insulating film, a resistance change film which is formed along a side surface of the first electrode and extends parallel to the first electrode, and a second electrode which is formed between the first interlayer insulating film and the second interlayer insulating film. The second electrode includes a conductive film which is made of metal and a diffusion preventing film which prevents diffusion of a conductive material contained in the conductive film.
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