发明授权
- 专利标题: Gas analyzing system
- 专利标题(中): 气体分析系统
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申请号: US13518693申请日: 2010-12-07
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公开(公告)号: US09347875B2公开(公告)日: 2016-05-24
- 发明人: Masaru Miyai , Masahiro Nishikawa
- 申请人: Masaru Miyai , Masahiro Nishikawa
- 申请人地址: JP Kyoto, Kyoto
- 专利权人: HORIBA, LTD.
- 当前专利权人: HORIBA, LTD.
- 当前专利权人地址: JP Kyoto, Kyoto
- 代理机构: Brooks Kushman P.C.
- 优先权: JP2009-295887 20091225
- 国际申请: PCT/JP2010/071865 WO 20101207
- 国际公布: WO2011/077938 WO 20110630
- 主分类号: G01N33/00
- IPC分类号: G01N33/00 ; G01N21/3504 ; G01N21/27
摘要:
A gas analyzing system that can perform calibration without being influenced by the deterioration of span gas in a span gas supply line. An open-close device control part that receives a calibration start signal issuing an instruction to start zero calibration and span calibration, and controls an open-close device for a span gas flow path. An open-close device for a zero gas flow path, wherein if the open-close device control part receives a new calibration start signal after a predetermined time has passed since previous calibration was performed, before the span calibration is started, for a predetermined time, the open-close device control part controls the open-close device for the span gas flow path so as to open the open-close device for the span gas flow path, and thereby purges span gas that remains in the span gas flow path.
公开/授权文献
- US20120260715A1 GAS ANALYZING SYSTEM 公开/授权日:2012-10-18
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