Invention Grant
- Patent Title: Iterative approach to detect outliers
- Patent Title (中): 检测异常值的迭代方法
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Application No.: US14107561Application Date: 2013-12-16
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Publication No.: US09348878B2Publication Date: 2016-05-24
- Inventor: Unmesh Sreedharan , Ajay Kumar Gupta , John MacGregor , Chandrashekar Vasudevan
- Applicant: SAP SE
- Applicant Address: DE Walldorf
- Assignee: SAP SE
- Current Assignee: SAP SE
- Current Assignee Address: DE Walldorf
- Agency: Dilworth IP LLC
- Main IPC: G06F17/30
- IPC: G06F17/30

Abstract:
An iterative approach to detect outliers may automatically detect outliers in a data set. The iterative approach may include calculating a mean and an average deviation for a list. The iterative approach may further include calculating the deviations of values of a list if the average deviation is not zero. Any values where the calculated deviation of the point or value is greater than the mean may be selected. The selected points may be set as a second list. The second list may be used by the iterative approach until no points are selected for the second list. The previous list is the set of outliers from the data set.
Public/Granted literature
- US20150169706A1 ITERATIVE APPROACH TO DETECT OUTLIERS Public/Granted day:2015-06-18
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