发明授权
- 专利标题: Resistive memory device and operating method
- 专利标题(中): 电阻式存储器件及操作方法
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申请号: US14800727申请日: 2015-07-16
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公开(公告)号: US09355721B2公开(公告)日: 2016-05-31
- 发明人: Chi-Weon Yoon , Hyun-Kook Park , Dae-Seok Byeon
- 申请人: Chi-Weon Yoon , Hyun-Kook Park , Dae-Seok Byeon
- 申请人地址: KR Suwon-si, Gyeonggi-do
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Suwon-si, Gyeonggi-do
- 代理机构: Volentine & Whitt, PLLC
- 优先权: KR10-2014-0148455 20141029
- 主分类号: G11C11/34
- IPC分类号: G11C11/34 ; G11C16/04 ; G11C13/00
摘要:
A method of operating a memory device includes; applying a pre-write voltage to a selected memory cell by applying a first voltage to a first signal line connected to the selected memory cell and a second voltage to a second signal line connected to the selected memory cell during a first set writing interval, wherein a level of the first voltage is higher than a level of the second voltage, and thereafter, applying a write voltage to the selected memory cell by applying a third voltage having a level lower than the level of the first voltage and higher than the level of the second voltage to the first signal line during a second set writing interval.
公开/授权文献
- US20160125942A1 RESISTIVE MEMORY DEVICE AND OPERATING METHOD 公开/授权日:2016-05-05
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