Invention Grant
- Patent Title: Solid electrolytic capacitor with high temperature leakage stability
- Patent Title (中): 固体电解电容器具有高温漏电稳定性
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Application No.: US14063205Application Date: 2013-10-25
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Publication No.: US09362056B2Publication Date: 2016-06-07
- Inventor: Antony P. Chacko , Randolph S. Hahn , Pablo Antonio Ruiz
- Applicant: Kemet Electronics Corporation
- Applicant Address: US SC Simpsonville
- Assignee: Kemet Electronics Corporation
- Current Assignee: Kemet Electronics Corporation
- Current Assignee Address: US SC Simpsonville
- Agency: Perkins Law Firm, LLC
- Agent Joseph T. Guy
- Main IPC: H01G9/048
- IPC: H01G9/048 ; H01G9/00 ; H01G9/012 ; H01G9/15 ; C25D7/00 ; C25D11/26 ; H01G9/025 ; C25D11/04
Abstract:
A solid electrolytic capacitor and method for forming a solid electrolytic capacitor with high temperature leakage stability is described. The solid electrolytic capacitor has improved leakage current and is especially well suited for high temperature environments such as down-hole applications.
Public/Granted literature
- US20140055913A1 SOLID ELECTROLYTIC CAPACITOR WITH HIGH TEMPERATURE LEAKAGE STABILITY Public/Granted day:2014-02-27
Information query
