Invention Grant
- Patent Title: Determination of physical connectivity status of devices based on electrical measurement
- Patent Title (中): 基于电气测量确定设备的物理连接状态
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Application No.: US14559523Application Date: 2014-12-03
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Publication No.: US09366712B2Publication Date: 2016-06-14
- Inventor: Jason Wong , Gyudong Kim
- Applicant: Lattice Semiconductor Corporation
- Applicant Address: US OR Portland
- Assignee: Lattice Semiconductor Corporation
- Current Assignee: Lattice Semiconductor Corporation
- Current Assignee Address: US OR Portland
- Agency: Fenwick & West LLP
- Main IPC: G06F11/30
- IPC: G06F11/30 ; G01R31/02 ; G06F11/34

Abstract:
Embodiments of the invention are generally directed to determination of physical connectivity status of devices based on electrical measurement. An embodiment of a method includes discovering a connection of a first device with a second device, and performing an electrical measurement of the second device by the first device via the connection between the first device and the second device, where performing the electrical measurement includes sensing by the first device of an element of the second device. The method further includes, if the sensing by the first device fails to detect the element of the second device and a predetermined condition for the electrical measurement is enabled, then determining by the first device that the connection with the second device has been lost.
Public/Granted literature
- US20150089094A1 Determination of Physical Connectivity Status of Devices Based on Electrical Measurement Public/Granted day:2015-03-26
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