Invention Grant
- Patent Title: Run-length detection and correction
- Patent Title (中): 运行长度检测和校正
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Application No.: US14453287Application Date: 2014-08-06
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Publication No.: US09369237B2Publication Date: 2016-06-14
- Inventor: George Alan Wiley , Chulkyu Lee
- Applicant: QUALCOMM Incorporated
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- Agency: Loza & Loza, LLP
- Main IPC: H04L1/00
- IPC: H04L1/00 ; H04L12/26 ; H04L25/02 ; H04L25/14 ; H04L25/49

Abstract:
System, methods and apparatus are described that facilitate transmission of data, particularly between two devices within electronic equipment. The apparatus may determine whether a run-length violation will occur or is likely to occur if a first sequence of symbols provided by a mapper of an M-Wire N-Phase encoder is transmitted on a plurality of wires. A second sequence of symbols may be substituted for the first sequence of symbols. The second sequence of symbols may comprise a surplus sequence of symbols that is not used for mapping data in the mapper.
Public/Granted literature
- US20150043358A1 RUN-LENGTH DETECTION AND CORRECTION Public/Granted day:2015-02-12
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