Invention Grant
- Patent Title: Calibration of sampling phase and aperature errors in multi-phase sampling systems
- Patent Title (中): 多相采样系统中采样相位和温度误差的校准
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Application No.: US14788192Application Date: 2015-06-30
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Publication No.: US09369263B1Publication Date: 2016-06-14
- Inventor: Matthew B. Baecher , John F. Bulzacchelli , John F. Ewen , Gautam Gangasani , Mounir Meghelli, I , Matthew J. Paschal , Trushil N. Shah
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Scully, Scott, Murphy & Presser, P.C.
- Agent Steven Meyers, Esq.
- Main IPC: H04L7/00
- IPC: H04L7/00 ; H04L7/06 ; H04B17/21

Abstract:
Method and apparatus to calibrate sampling phases of a multi-phase sampling system. The method includes on-chip generating a pristine phase reference pattern signal for use in generating at least one reference output signal from a data path; sampling, responsive to a clock signal, the at least one reference output signal to obtain samples; and modifying a phase of the clock signal to align the obtained samples to pattern edges of at least one reference output signal. Both symmetric and asymmetric duty cycle distortion are removed from the pristine phase reference pattern signal input to the data path. The effects of asymmetric distortion in the data path output signal upon the phase calibration are cancelled by periodically inverting the at least one reference output signal. The method adjusts a first phase sampling clock signal output of an electronic phase rotator device to provide an initial alignment setting against a first edge of the reference output signal; and then implements phase calibration logic to align a second phase sampling clock signal against a second edge.
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