Invention Grant
- Patent Title: Back gate bias voltage control of oxide semiconductor transistor
- Patent Title (中): 氧化物半导体晶体管的背栅偏压控制
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Application No.: US14641733Application Date: 2015-03-09
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Publication No.: US09378777B2Publication Date: 2016-06-28
- Inventor: Jun Koyama
- Applicant: Semiconductor Energy Laboratory Co., Ltd.
- Applicant Address: JP Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Kanagawa-ken
- Agency: Fish & Richardson P.C.
- Priority: JP2014-048276 20140312
- Main IPC: G11C5/14
- IPC: G11C5/14 ; H01L29/786 ; G11C11/24 ; G11C19/28 ; G11C16/34 ; G11C7/12

Abstract:
To stably control a threshold voltage of a functional circuit using an oxide semiconductor. A variable bias circuit, a monitoring oxide semiconductor transistor including a back gate, a current source, a differential amplifier, a reference voltage source, and a functional circuit which includes an oxide semiconductor transistor including a back gate are provided. The current source supplies current between a source and a drain of the monitoring oxide semiconductor transistor to generate a gate-source voltage in accordance with the current. The differential amplifier compares the voltage with a voltage of the reference voltage source, amplifies a difference, and outputs a resulting voltage to the variable bias circuit. The variable bias circuit is controlled by an output of the differential amplifier and supplies voltage to the back gate of the monitoring oxide semiconductor transistor and the back gate of the oxide semiconductor transistor included in the functional circuit.
Public/Granted literature
- US20150263175A1 SEMICONDUCTOR DEVICE Public/Granted day:2015-09-17
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