发明授权
US09383334B2 Ion-sensitive layer structure for an ion-sensitive sensor and method for manufacturing the same
有权
用于离子敏感传感器的离子敏感层结构及其制造方法
- 专利标题: Ion-sensitive layer structure for an ion-sensitive sensor and method for manufacturing the same
- 专利标题(中): 用于离子敏感传感器的离子敏感层结构及其制造方法
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申请号: US14464268申请日: 2014-08-20
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公开(公告)号: US09383334B2公开(公告)日: 2016-07-05
- 发明人: Christian Kunath , Eberhard Kurth , Torsten Pechstein
- 申请人: Endress + Hauser Conducta Gesellschaft für Mess- und Regeltechnik mbH + Co. KG
- 申请人地址: DE
- 专利权人: Endress+Hauser Conducta GmbH+Co. KG
- 当前专利权人: Endress+Hauser Conducta GmbH+Co. KG
- 当前专利权人地址: DE
- 代理机构: PatServe
- 代理商 Christopher R. Powers
- 优先权: DE102013109357 20130829
- 主分类号: G01N27/414
- IPC分类号: G01N27/414 ; H01L21/28
摘要:
In a method for manufacturing an ion-sensitive structure for an ion-sensitive sensor, first a semiconductor substrate bearing an oxide layer is provided, whereupon a metal oxide layer and a metal layer are deposited and tempered, in order to obtain a layer sequence having a crystallized metal oxide layer and an oxidized and crystallized metal layer on the semiconductor substrate bearing the oxide layer. In such case, the metal oxide layer and the metal layer have a compatible metal element, and the coating thickness dMOX of the metal oxide layer is greater than the coating thickness dMET of the metal layer.
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