Invention Grant
US09391617B2 Hardware-embedded key based on random variations of a stress-hardened inegrated circuit
有权
基于应力硬化集成电路随机变化的硬件嵌入式键
- Patent Title: Hardware-embedded key based on random variations of a stress-hardened inegrated circuit
- Patent Title (中): 基于应力硬化集成电路随机变化的硬件嵌入式键
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Application No.: US13889849Application Date: 2013-05-08
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Publication No.: US09391617B2Publication Date: 2016-07-12
- Inventor: Sanu K. Mathew , Rachael J. Parker , Ram K. Krishnamurthy
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Garrett IP, LLC
- Main IPC: H03K19/003
- IPC: H03K19/003

Abstract:
An IC cell designed to assert one of multiple possible output states, each with equal probability, implemented to assert a pre-determined one of the multiple output states based on random variations within the IC cell, such as random process variations. An array of IC cells is configurable to provide a hardware-embedded key upon power-up that is unique to the combination of random variations of selected IC cells, resistant to tampering prior to and during manufacture, and tolerant to aging, instantaneous thermal noise, and environmental variations, such as voltage and temperature fluctuations. The key may be used as, without limitation, a Platform Root Key, a High-Bandwidth Digital Content Protection (HDCP) key, an Enhanced Privacy Identification (EPID) key, and/or an Advanced Access Content System (AACS) key. Also disclosed are techniques to measure stability and stress-harden an IC cell based on output states of the IC cell.
Public/Granted literature
- US20140266297A1 HARDWARE-EMBEDDED KEY BASED ON RANDOM VARIATIONS OF A STRESS-HARDENED INEGRATED CIRCUIT Public/Granted day:2014-09-18
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