Invention Grant
US09398676B2 System and method for quantifying X-ray backscatter system performance
有权
用于量化X射线反向散射系统性能的系统和方法
- Patent Title: System and method for quantifying X-ray backscatter system performance
- Patent Title (中): 用于量化X射线反向散射系统性能的系统和方法
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Application No.: US14269930Application Date: 2014-05-05
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Publication No.: US09398676B2Publication Date: 2016-07-19
- Inventor: Matthew T. Grimshaw , Talion Edwards , Gary E. Georgeson , Daniel J. Wright , James E. Engel , Morteza Safai , Yuan-Jye Wu , Taisia Tsukruk Lou , Rodney S. Wright
- Applicant: The Boeing Company
- Applicant Address: US IL Chicago
- Assignee: THE BOEING COMPANY
- Current Assignee: THE BOEING COMPANY
- Current Assignee Address: US IL Chicago
- Agency: Thompson Hine LLP
- Main IPC: G01N23/203
- IPC: G01N23/203 ; H05G1/26 ; G01V5/00

Abstract:
A system for quantifying x-ray backscatter system performance may include a support, a plurality of rods mounted on the support, the rods of the plurality of rods arranged in parallel to each other, having generally curved outer surfaces, and being arranged in groups of varying widths, each group of the groups having at least two of the rods of a same width, and a user interface configured to be connected to receive a backscatter signal from an x-ray backscatter detector associated with an x-ray tube, and generate a display representing photon counts of x-ray backscatter for each rod of the plurality of rods from x-rays transmitted by the x-ray tube.
Public/Granted literature
- US20150319832A1 System and Method for Quantifying X-Ray Backscatter System Performance Public/Granted day:2015-11-05
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