A method and apparatus of a device that manages a thermal profile of a device by selectively throttling input/output operations of the device is described. In an exemplary embodiment, the device monitors the thermal profile of the device, where the device executes a plurality of processes that utilize storage of the device. In addition, the plurality of processes include a high priority process and a low priority process. If the thermal profile of the device exceeds a thermal threshold, the device decreases a first bandwidth range for the low priority process and maintains a second bandwidth range for the high priority process. The device further processes a storage request of the low priority process using the first bandwidth range and processing a storage request of the high priority process using the second bandwidth range.