发明授权
- 专利标题: Method of testing thermally-assisted magnetic head
- 专利标题(中): 热辅助磁头测试方法
-
申请号: US14710735申请日: 2015-05-13
-
公开(公告)号: US09437226B1公开(公告)日: 2016-09-06
- 发明人: Tadatoshi Koba , Seiichi Takayama , Ryuji Fujii , Takashi Honda , Osamu Harakawa , Masahiro Kuribayashi
- 申请人: SAE Magnetics (H.K.) Ltd.
- 申请人地址: CN Hong Kong
- 专利权人: SAE MAGNETICS (H.K.) LTD.
- 当前专利权人: SAE MAGNETICS (H.K.) LTD.
- 当前专利权人地址: CN Hong Kong
- 代理机构: Nixon & Vanderhye PC
- 主分类号: G11B5/455
- IPC分类号: G11B5/455 ; G11B5/127 ; G11B5/00 ; G11B5/60 ; G11B5/012
摘要:
A method of testing a TAMH includes providing a slider body having a waveguide embedded therein with an incidence end extending toward a back surface of the slider body; providing a light source unit including a light source and a unit substrate; coating a bonding material layer on the back surface, under the bottom, or both on the back surface and under the bottom of the unit substrate; coating a localization material layer on the back surface; aligning the light source unit to the slider body; causing a light emitted from the light source and allowed to be incident on the incidence end to anneal the localization material layer to generate an annealing mark; removing the light source unit or the light source from the slider body; and measuring a position offset between the annealing mark and the incidence end. The method can evaluate alignment accuracy of a slider body and a light source unit in two dimensional directions.
信息查询
IPC分类: