Invention Grant
- Patent Title: Measuring leakage currents and measuring circuit for carrying out such measuring
- Patent Title (中): 测量泄漏电流和进行这种测量的测量电路
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Application No.: US14326263Application Date: 2014-07-08
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Publication No.: US09442149B2Publication Date: 2016-09-13
- Inventor: Marco Pasotti , Fabio De Santis
- Applicant: STMicroelectronics S.r.l.
- Applicant Address: IT Agrate Brianza (MB)
- Assignee: STMicroelectronics S.r.l.
- Current Assignee: STMicroelectronics S.r.l.
- Current Assignee Address: IT Agrate Brianza (MB)
- Agency: Gardere Wynne Sewell LLP
- Priority: ITMI2013A1144 20130708
- Main IPC: H01H31/12
- IPC: H01H31/12 ; G01R31/02 ; G01R19/165

Abstract:
An embodiment of a measuring circuit for measuring the leakage current flowing in a portion of an electronic device when said portion is biased by a biasing unit of the electronic device is proposed. The measuring circuit includes a first section configured to generate a threshold current, a second section configured to receive the leakage current, a third section configured to compare the threshold current with the leakage current, and a fourth section configured to generate an output voltage based on the comparison between the threshold current and the leakage current. Said first section is configured to set the value of said threshold current to a different value at each reiteration of an operating cycle. Said fourth section is configured to measure said leakage current based on a detection of a change in the value of the output voltage between two reiterations of the operating cycle.
Public/Granted literature
- US20150008939A1 MEASURING LEAKAGE CURRENTS AND MEASURING CIRCUIT FOR CARRYING OUT SUCH MEASURING Public/Granted day:2015-01-08
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