Invention Grant
US09448155B2 System for sampling and/or analysis of particles in a gaseous environment
有权
在气体环境中对颗粒进行取样和/或分析的系统
- Patent Title: System for sampling and/or analysis of particles in a gaseous environment
- Patent Title (中): 在气体环境中对颗粒进行取样和/或分析的系统
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Application No.: US14740676Application Date: 2015-06-16
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Publication No.: US09448155B2Publication Date: 2016-09-20
- Inventor: Yongle Pan
- Applicant: U.S. Army Research Laboratory ATTN: RDRL-LOC-I
- Applicant Address: US DC Washington
- Assignee: The United States of America as represented by the Secretary of the Army
- Current Assignee: The United States of America as represented by the Secretary of the Army
- Current Assignee Address: US DC Washington
- Agent Eric Brett Compton
- Main IPC: G01N1/00
- IPC: G01N1/00 ; G01N15/14 ; G01N21/65 ; G01N15/00

Abstract:
A system for trapping particles in a gas comprising a chamber; an intake for intake of a gas containing at least one particle to be trapped and released, and an outlet for exit of the gas out of the chamber containing at least one particle; a first passage operatively connected to the intake operating to create a flow of a gas containing at least one particle into the chamber, a second passage operatively connected to the outlet for flow of the gas; a third passage operatively connected to a gaseous flow for creating a flow of fluid in a direction substantially opposite to the transfer of gas from the first passage so as to counteract the flow of gas from the first passage; an image sensor for recording an image; and a laser for generating a light beam for forming a photophoretic trap between the first and third passages.
Public/Granted literature
- US20150377764A1 SYSTEM FOR SAMPLING AND/OR ANALYSIS OF PARTICLES IN A GASEOUS ENVIRONMENT Public/Granted day:2015-12-31
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