Invention Grant
US09448903B2 Multiple test type analysis for a test case using test case metadata
有权
使用测试用例元数据的测试用例的多种测试类型分析
- Patent Title: Multiple test type analysis for a test case using test case metadata
- Patent Title (中): 使用测试用例元数据的测试用例的多种测试类型分析
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Application No.: US14499276Application Date: 2014-09-29
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Publication No.: US09448903B2Publication Date: 2016-09-20
- Inventor: Anoop Shukla , Vineet Kumar Sinha , Prasenjit Sarkar , Prashant Kumar
- Applicant: VMWARE, INC.
- Applicant Address: US CA Palo Alto
- Assignee: VMware, Inc.
- Current Assignee: VMware, Inc.
- Current Assignee Address: US CA Palo Alto
- Priority: IN4007/CHE/2014 20140816
- Main IPC: G06F9/44
- IPC: G06F9/44 ; G06F11/263
Abstract:
In one embodiment, a method determines a test case containing test code for testing a functionality of a computer system. The test case is associated with metadata. The metadata is parsed to determine a plurality of system test types and one or more parameters for the plurality of system test types wherein the one or more parameters indicate system conditions for the computer system. The method executes a set of tests using the test code with the computer system using the system conditions. Results of the executed set of tests are output for the plurality of system test types.
Public/Granted literature
- US20160048437A1 MULTIPLE TEST TYPE ANALYSIS FOR A TEST CASE USING TEST CASE METADATA Public/Granted day:2016-02-18
Information query
