Invention Grant
- Patent Title: System and apparatus for measurement of light scattering from a sample
- Patent Title (中): 用于测量样品的光散射的系统和装置
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Application No.: US13874956Application Date: 2013-05-01
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Publication No.: US09459206B2Publication Date: 2016-10-04
- Inventor: Zhiling Xu
- Applicant: Datacolor, Inc.
- Applicant Address: CH Luzern
- Assignee: DATACOLOR HOLDING AG
- Current Assignee: DATACOLOR HOLDING AG
- Current Assignee Address: CH Luzern
- Agency: Leason Ellis LLP
- Main IPC: G01B11/22
- IPC: G01B11/22 ; G01N21/55 ; G01N21/00 ; G08B21/00 ; G01C19/00 ; G01N21/47 ; G01N21/57

Abstract:
An apparatus and method for providing a solution that enables technicians or other technical professionals to obtain accurate gloss, haze and DOI values for a reflecting sample due to the surface conditions of the sample. The apparatus and method allow for the generation of a data model of the surface of a sample using a sensor array designed to detect the divergence of a collimated beam of light reflected off the surface of the sample. The same principle enables technical professionals to obtain accurate haze and clarity values for a transparent or translucent sample that is trans-illuminated by light.
Public/Granted literature
- US20130293897A1 SYSTEM AND APPARATUS FOR MEASUREMENT OF LIGHT SCATTERING FROM A SAMPLE Public/Granted day:2013-11-07
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