发明授权
- 专利标题: Method of manufacturing semiconductor device, substrate processing apparatus, and semiconductor device
- 专利标题(中): 制造半导体器件,衬底处理设备和半导体器件的方法
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申请号: US12849398申请日: 2010-08-03
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公开(公告)号: US09466477B2公开(公告)日: 2016-10-11
- 发明人: Tatsuyuki Saito , Masanori Sakai , Yukinao Kaga , Takashi Yokogawa
- 申请人: Tatsuyuki Saito , Masanori Sakai , Yukinao Kaga , Takashi Yokogawa
- 申请人地址: JP Tokyo
- 专利权人: Hitachi Kokusai Electric Inc.
- 当前专利权人: Hitachi Kokusai Electric Inc.
- 当前专利权人地址: JP Tokyo
- 代理机构: Brundidge & Stanger, P.C.
- 优先权: JP2009-181637 20090804; JP2010-160873 20100715
- 主分类号: H01L21/02
- IPC分类号: H01L21/02 ; C23C16/34 ; C23C16/455 ; C23C16/52 ; H01L21/285
摘要:
There are provided a method of manufacturing a semiconductor device, a substrate processing apparatus, and a semiconductor device. The method allows rapid formation of a conductive film, which has a low concentration of impurities permeated from a source owing to its dense structure, and a low resistivity. The method is performed by simultaneously supplying two or more kinds of sources into a processing chamber to form a film on a substrate placed in the processing chamber. The method comprises: performing a first source supply process by supplying at least one kind of source into the processing chamber at a first supply flow rate; and performing a second source supply process by supplying the at least one kind of source into the processing chamber at a second supply flow rate different from the first supply flow rate.
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