Invention Grant
- Patent Title: Techniques for testing receiver operation
- Patent Title (中): 测试接收机操作的技术
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Application No.: US14550822Application Date: 2014-11-21
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Publication No.: US09473259B2Publication Date: 2016-10-18
- Inventor: Itamar Levin , Kevan A. Lillie , Dima Hammed , Elior Segev , Mingming Xu , Tomer Fael
- Applicant: INTEL CORPORATION
- Applicant Address: US CA Santa Clara
- Assignee: INTEL CORPORATION
- Current Assignee: INTEL CORPORATION
- Current Assignee Address: US CA Santa Clara
- Main IPC: H04B17/00
- IPC: H04B17/00 ; H04B17/24 ; H04B17/29 ; H04L25/03

Abstract:
Various embodiments are generally directed to techniques for testing a receiver incorporated into an IC to receive a bitstream. An apparatus includes a precharge component to set a VGA to output a differential bias voltage; a taps component to set a tap to form a feedback loop that extends from an output of the bit slicer to the input of the bit slicer through a delay circuit and the tap, the tap to output a first differential voltage to the input of the bit slicer to invert a polarity of a sum of differential voltages at the input of the bit slicer to enable oscillation of the bit slicer, the sum generated from at least the differential bias voltage and the first differential voltage; and a capture component coupled to the output of the bit slicer to capture a series of bit values therefrom. Other embodiments are described and claimed.
Public/Granted literature
- US20160149656A1 TECHNIQUES FOR TESTING RECEIVER OPERATION Public/Granted day:2016-05-26
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